ZLIP Series Isolated Probe

ZLIP Series Isolated Probe (200MHz / 500MHz)

The ZLIP Series isolated probe adopts proprietary isolation technology to achieve electrical isolation between input and output signals, effectively eliminating ground loop interference and high-voltage crosstalk, ensuring measurement accuracy and system safety.

Designed for high-speed power devices such as SiC, GaN, and IGBT, it provides extremely high common-mode rejection performance during gate drive signal measurements.

Advantages of ZLIP Isolated Probe

Applications of ZLIP Isolated Probe

Technical Specifications

Parameter ZLIP200 ZLIP500
Bandwidth (-3dB)200MHz500MHz
Rise Time≤1.75ns≤700ps
Accuracy±1%
Noise0.8mVrms
Common-Mode Voltage10kVpk

Sensor Front-End

Sensor Front-End Differential Input Voltage Range Single-Ended Input Impedance
IP-LV (Standard) 1X: ±1V
10X: ±10V
50X: ±50V
9MΩ ∥ 10pF
IP-HV (Optional) 50X: ±50V
500X: ±500V
2500X: ±2500V
99MΩ ∥ 5pF

Common-Mode Rejection Ratio (CMRR)

Frequency DC 1M 100M 200M 500M
Typical 140dB 100dB 90dB 80dB 70dB

Note: CMRR gradually decreases as frequency increases.

Common-Mode Comparison

Common-Mode Comparison

Common-Mode Comparison: Ch.1 – ZLIP200 Isolated Probe, Ch.2 – ZLHV2150 Differential Probe

Maximum Non-Destructive Differential Voltage

Sensor Front-End Vpk (DC + AC Peak)
IP-LV 600Vpp
IP-HV 5KVpp