The ZLIP Series isolated probe adopts proprietary isolation technology to achieve electrical isolation between input and output signals, effectively eliminating ground loop interference and high-voltage crosstalk, ensuring measurement accuracy and system safety.
Designed for high-speed power devices such as SiC, GaN, and IGBT, it provides extremely high common-mode rejection performance during gate drive signal measurements.
| Parameter | ZLIP200 | ZLIP500 |
|---|---|---|
| Bandwidth (-3dB) | 200MHz | 500MHz |
| Rise Time | ≤1.75ns | ≤700ps |
| Accuracy | ±1% | |
| Noise | 0.8mVrms | |
| Common-Mode Voltage | 10kVpk | |
| Sensor Front-End | Differential Input Voltage Range | Single-Ended Input Impedance |
|---|---|---|
| IP-LV (Standard) |
1X: ±1V 10X: ±10V 50X: ±50V |
9MΩ ∥ 10pF |
| IP-HV (Optional) |
50X: ±50V 500X: ±500V 2500X: ±2500V |
99MΩ ∥ 5pF |
| Frequency | DC | 1M | 100M | 200M | 500M |
|---|---|---|---|---|---|
| Typical | 140dB | 100dB | 90dB | 80dB | 70dB |
Note: CMRR gradually decreases as frequency increases.
Common-Mode Comparison: Ch.1 – ZLIP200 Isolated Probe, Ch.2 – ZLHV2150 Differential Probe
| Sensor Front-End | Vpk (DC + AC Peak) |
|---|---|
| IP-LV | 600Vpp |
| IP-HV | 5KVpp |